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Published:IEEE / Institute of Electrical and Electronics Engineers Incorporated
Format:Electronic Resource, Remote
Published:IEEE / Institute of Electrical and Electronics Engineers Incorporated
Format:Electronic Resource, Remote
Published:IEEE / Institute of Electrical and Electronics Engineers Incorporated
Format:Electronic Resource, Remote
Published:IEEE / Institute of Electrical and Electronics Engineers Incorporated
Format:Electronic Resource, Remote
Published:IEEE / Institute of Electrical and Electronics Engineers Incorporated
Format:Electronic Resource, Remote
1003.3-1991 IEEE Standard for Information Technology-Test Methods for Measuring Conformance to POSIX
Published:IEEE / Institute of Electrical and Electronics Engineers Incorporated
Format:Electronic Resource, Remote
Published:IEEE / Institute of Electrical and Electronics Engineers Incorporated
Format:Electronic Resource, Remote
Published:IEEE / Institute of Electrical and Electronics Engineers Incorporated
Format:Electronic Resource, Remote
Published:Weinheim ; New York : VCH, c1996
Format:Print
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Published:New York, NY : Springer, c2009
Format:Electronic Resource, Remote
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Published:Princeton, N.J. : Princeton University Press, [1993]
Format:Print
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Published:Cambridge, Mass. : Belknap, 2007
Format:Print
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Published:Cambridge, Mass. : Belknap Press of Harvard University Press, c2006
Format:Print
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Published:[New Rochelle, N.Y. : Cuisenaire Co. of America, 199-?]
Format:Print
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Published:Ann Arbor : University of Michigan Press, c2010
Format:Print
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